SHELXTL(tm) is a complete, proprietary suite of programs for the determination of crystal structures from X-ray or neutron data. It includes space group determination, direct methods, Patterson search, rotation/translation search, full matrix least squares refinement, interactive color graphics for structure solution, and output of final plots (including thermal ellipsoids) for publication, 3-D color graphics, preparation of manuscripts and tables for publication, poster preparation, and powder pattern generation. Calculations are valid for all space groups, in all orientations, and there is no effective limit on the number of reflections per structure.
Susan K. Byram
Product Manager Siemens Industrial Automation, Analytical Instrumentation Div. 6300 Enterprise Lane Madison, WI 53719-1173 USA 608-276-3041 fax:608-276-3006