SAINT integrates raw data frames or images from Siemens two-dimensional detectors (HI-STAR, SMART, X1000, X100) used to collect single crystal X-ray diffraction data extremely rapidly. It provides exceptionally accurate 3D integrated intensities of each reflection by using Kabsch profiling and absorption and time decay corrections. Output is provided in SHELXTL(tm) format for use in small molecule structure determination, and in biological macromolecule least-squares refinement.
Susan K. Byram
Product Manager Siemens Industrial Automation, Analytical Instrumentation Div. 6300 Enterprise Lane Madison, WI 53719-1173 USA 608-276-3041 fax:608-276-3006